LBIC imaging of semiconductor arrays: The cross-sectional model

Weifu Fang; K. Ito; D. A. Redfern

doi:10.1016/j.mcm.2003.10.045

LBIC imaging of semiconductor arrays: The cross-sectional model

Weifu Fang, K. Ito, D. A. Redfern

Wright State University

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	127-136
Number of pages	10
Journal	Mathematical and Computer Modelling
Volume	40
Issue number	1-2
DOIs	https://doi.org/10.1016/j.mcm.2003.10.045
State	Published - Jul 1 2004

ASJC Scopus Subject Areas

Modeling and Simulation
Computer Science Applications

Keywords

Homogenization
Inverse problem
LBIC
Parameter identification
Semiconductor arrays

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10.1016/j.mcm.2003.10.045

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title = "LBIC imaging of semiconductor arrays: The cross-sectional model",

keywords = "Homogenization, Inverse problem, LBIC, Parameter identification, Semiconductor arrays",

author = "Weifu Fang and K. Ito and Redfern, {D. A.}",

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TY - JOUR

T1 - LBIC imaging of semiconductor arrays

T2 - The cross-sectional model

AU - Fang, Weifu

AU - Ito, K.

AU - Redfern, D. A.

PY - 2004/7/1

Y1 - 2004/7/1

KW - Homogenization

KW - Inverse problem

KW - LBIC

KW - Parameter identification

KW - Semiconductor arrays

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JO - Mathematical and Computer Modelling

JF - Mathematical and Computer Modelling

IS - 1-2

ER -

LBIC imaging of semiconductor arrays: The cross-sectional model

ASJC Scopus Subject Areas

Keywords

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