Magnetic-multilayered interconnects featuring skin effect suppression

Yan Zhuang, B. Rejaei, H. Schellevis, M. Vroubel, J. N. Burghartz

Research output: Contribution to journalArticlepeer-review

Abstract

A novel concept for a high-frequency, low-loss interconnect with significant skin effect suppression over a wide frequency band is presented. The concept is based on a multilayer comprising thin magnetic N80Fe20 and metal (Cu) layers. The negative permeability of the magnetic layers leads to a near-cancellation of the overall permeability of the multilayer stack. This results in a significant increase of skin depth and thus, a more uniform distribution of the current density and a dramatic reduction of loss within a certain frequency range. Coplanar waveguides built using the multilayer technology show more than 50% loss reduction at 14 GHz compared to their thick Cu-based counterparts.
Original languageEnglish
Pages (from-to)319-321
Number of pages3
JournalIEEE Electron Device Letters
Volume29
Issue number4
Early online dateMar 21 2008
DOIs
StatePublished - Apr 2008
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Keywords

  • Interconnections
  • Magnetic layered films
  • Magnetic resonance
  • Microwave technology
  • Transmission lines

Disciplines

  • Electrical and Computer Engineering

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