Abstract
A novel concept for a high-frequency, low-loss interconnect with significant skin effect suppression over a wide frequency band is presented. The concept is based on a multilayer comprising thin magnetic N80Fe20 and metal (Cu) layers. The negative permeability of the magnetic layers leads to a near-cancellation of the overall permeability of the multilayer stack. This results in a significant increase of skin depth and thus, a more uniform distribution of the current density and a dramatic reduction of loss within a certain frequency range. Coplanar waveguides built using the multilayer technology show more than 50% loss reduction at 14 GHz compared to their thick Cu-based counterparts.
Original language | English |
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Pages (from-to) | 319-321 |
Number of pages | 3 |
Journal | IEEE Electron Device Letters |
Volume | 29 |
Issue number | 4 |
Early online date | Mar 21 2008 |
DOIs | |
State | Published - Apr 2008 |
Externally published | Yes |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
Keywords
- Interconnections
- Magnetic layered films
- Magnetic resonance
- Microwave technology
- Transmission lines
Disciplines
- Electrical and Computer Engineering