Massive point defect redistribution near semiconductor surfaces and interfaces and its impact on Schottky barrier formation

L. J. Brillson, Y. Dong, D. Doutt, D. C. Look, Z. Q. Fang

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)4768-4773
Number of pages6
JournalPhysica B: Condensed Matter
Volume404
Issue number23-24
DOIs
StatePublished - Dec 15 2009

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Keywords

  • Cathodoluminescence spectroscopy
  • Defects
  • Interfaces
  • Schottky barriers
  • Segregation

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