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Massive point defect redistribution near semiconductor surfaces and interfaces and its impact on Schottky barrier formation

  • L. J. Brillson
  • , Y. Dong
  • , D. Doutt
  • , D. C. Look
  • , Z. Q. Fang

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)4768-4773
Number of pages6
JournalPhysica B: Condensed Matter
Volume404
Issue number23-24
DOIs
StatePublished - Dec 15 2009

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Keywords

  • Cathodoluminescence spectroscopy
  • Defects
  • Interfaces
  • Schottky barriers
  • Segregation

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