Mobility Measurements with a Standard Contact Resistance Pattern

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	162-164
Number of pages	3
Journal	IEEE Electron Device Letters
Volume	8
Issue number	4
DOIs	https://doi.org/10.1109/EDL.1987.26588
State	Published - Apr 1987

ASJC Scopus Subject Areas

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title = "Mobility Measurements with a Standard Contact Resistance Pattern",

author = "Look, {D. C.}",

year = "1987",

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