Mobility Measurements with a Standard Contact Resistance Pattern

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	162-164
Number of pages	3
Journal	IEEE Electron Device Letters
Volume	8
Issue number	4
DOIs	https://doi.org/10.1109/EDL.1987.26588
State	Published - Apr 1987

ASJC Scopus Subject Areas

@article{14f6197376c44f61842490519c93a1be,

title = "Mobility Measurements with a Standard Contact Resistance Pattern",

author = "Look, \{D. C.\}",

year = "1987",

month = apr,

doi = "10.1109/EDL.1987.26588",

language = "English",

volume = "8",

pages = "162--164",

journal = "IEEE Electron Device Letters",

issn = "0741-3106",

number = "4",

}

TY - JOUR

T1 - Mobility Measurements with a Standard Contact Resistance Pattern

AU - Look, D. C.

PY - 1987/4

Y1 - 1987/4

UR - https://www.scopus.com/pages/publications/0023330846

UR - https://www.scopus.com/inward/citedby.url?scp=0023330846&partnerID=8YFLogxK

U2 - 10.1109/EDL.1987.26588

DO - 10.1109/EDL.1987.26588

M3 - Article

AN - SCOPUS:0023330846

SN - 0741-3106

VL - 8

SP - 162

EP - 164

JO - IEEE Electron Device Letters

JF - IEEE Electron Device Letters

IS - 4

ER -