Model for thickness dependence of mobility and concentration in highly conductive zinc oxide

David C. Look, D. Leedy Kevin, Kiefer Arnold Kiefer, Claflin Bruce Claflin, Naho Itagaki, Koichi Matsushima, Iping Surhariadi

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number033801
JournalOptical Engineering
Volume52
Issue number3
DOIs
StatePublished - 2013

ASJC Scopus Subject Areas

  • Atomic and Molecular Physics, and Optics
  • General Engineering

Keywords

  • Hall effect
  • Mobility
  • Reflectance
  • Thickness dependence
  • Zinc oxide

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