Model for thickness dependence of mobility and concentration in highly conductive zinc oxide

  • David C. Look
  • , D. Leedy Kevin
  • , Kiefer Arnold Kiefer
  • , Claflin Bruce Claflin
  • , Naho Itagaki
  • , Koichi Matsushima
  • , Iping Surhariadi

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number033801
JournalOptical Engineering
Volume52
Issue number3
DOIs
StatePublished - 2013

ASJC Scopus Subject Areas

  • Atomic and Molecular Physics, and Optics
  • General Engineering

Keywords

  • Hall effect
  • Mobility
  • Reflectance
  • Thickness dependence
  • Zinc oxide

Cite this