Model-free determination of optical constants: Application to undoped and Ga-doped ZnO

David C. Look; Buguo Wang; Kevin D. Leedy

doi:10.1117/12.2255769

Model-free determination of optical constants: Application to undoped and Ga-doped ZnO

David C. Look, Buguo Wang, Kevin D. Leedy

Future of Semiconductors, a National Science Foundation Program

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Oxide-Based Materials and Devices VIII 2017
Editors	Ferechteh H. Teherani, David C. Look, David J. Rogers, Ivan Bozovic
Publisher	SPIE
ISBN (Electronic)	9781510606517
DOIs	https://doi.org/10.1117/12.2255769
State	Published - 2017
Event	Oxide-Based Materials and Devices VIII 2017 - San Francisco, United States Duration: Jan 29 2017 → Feb 1 2017

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	10105
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Oxide-Based Materials and Devices VIII 2017
Country/Territory	United States
City	San Francisco
Period	1/29/17 → 2/1/17

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Keywords

Absorption coefficient
Index of refraction
Reflectance
Reflection coefficient
Transmittance
ZnO

Access to Document

10.1117/12.2255769

Cite this

Look, D. C., Wang, B., & Leedy, K. D. (2017). Model-free determination of optical constants: Application to undoped and Ga-doped ZnO. In F. H. Teherani, D. C. Look, D. J. Rogers, & I. Bozovic (Eds.), Oxide-Based Materials and Devices VIII 2017 Article 101050H (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10105). SPIE. https://doi.org/10.1117/12.2255769

Model-free determination of optical constants: Application to undoped and Ga-doped ZnO. / Look, David C.; Wang, Buguo; Leedy, Kevin D.
Oxide-Based Materials and Devices VIII 2017. ed. / Ferechteh H. Teherani; David C. Look; David J. Rogers; Ivan Bozovic. SPIE, 2017. 101050H (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10105).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Look, DC, Wang, B & Leedy, KD 2017, Model-free determination of optical constants: Application to undoped and Ga-doped ZnO. in FH Teherani, DC Look, DJ Rogers & I Bozovic (eds), Oxide-Based Materials and Devices VIII 2017., 101050H, Proceedings of SPIE - The International Society for Optical Engineering, vol. 10105, SPIE, Oxide-Based Materials and Devices VIII 2017, San Francisco, United States, 1/29/17. https://doi.org/10.1117/12.2255769

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title = "Model-free determination of optical constants: Application to undoped and Ga-doped ZnO",

keywords = "Absorption coefficient, Index of refraction, Reflectance, Reflection coefficient, Transmittance, ZnO",

author = "Look, {David C.} and Buguo Wang and Leedy, {Kevin D.}",

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year = "2017",

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BT - Oxide-Based Materials and Devices VIII 2017

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Model-free determination of optical constants: Application to undoped and Ga-doped ZnO

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

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