Modeling and analysis of laser-beam-induced current images in semiconductors

Stavros Busenberg, Weifu Fang, Kazufumi Ito

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)187-204
Number of pages18
JournalSIAM Journal on Applied Mathematics
Volume53
Issue number1
DOIs
StatePublished - Feb 1 1993

ASJC Scopus Subject Areas

  • Applied Mathematics

Keywords

  • identification problem
  • laser-beam-induced currents (LBIC)
  • nonlinear elliptic systems
  • semiconductors

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