Modeling and analysis of laser-beam-induced current images in semiconductors

Stavros Busenberg, Weifu Fang, Kazufumi Ito

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	187-204
Number of pages	18
Journal	SIAM Journal on Applied Mathematics
Volume	53
Issue number	1
DOIs	https://doi.org/10.1137/0153012
State	Published - 1993

ASJC Scopus Subject Areas

@article{a1b5bbacd7124b39bd61cd16ba376c34,

title = "Modeling and analysis of laser-beam-induced current images in semiconductors",

author = "Stavros Busenberg and Weifu Fang and Kazufumi Ito",

year = "1993",

doi = "10.1137/0153012",

language = "English",

volume = "53",

pages = "187--204",

journal = "SIAM Journal on Applied Mathematics",

issn = "0036-1399",

number = "1",

}

TY - JOUR

T1 - Modeling and analysis of laser-beam-induced current images in semiconductors

AU - Busenberg, Stavros

AU - Fang, Weifu

AU - Ito, Kazufumi

PY - 1993

Y1 - 1993

UR - https://www.scopus.com/pages/publications/0027544131

UR - https://www.scopus.com/inward/citedby.url?scp=0027544131&partnerID=8YFLogxK

U2 - 10.1137/0153012

DO - 10.1137/0153012

M3 - Article

AN - SCOPUS:0027544131

SN - 0036-1399

VL - 53

SP - 187

EP - 204

JO - SIAM Journal on Applied Mathematics

JF - SIAM Journal on Applied Mathematics

IS - 1

ER -