Modeling of strained CMOS on disposable SiGe dots: Shape impacts on electrical/thermal characteristics

Sébastien Frégonèse; Yan Zhuang; Joachim N. Burghartz

doi:10.1016/j.sse.2008.01.022

Modeling of strained CMOS on disposable SiGe dots: Shape impacts on electrical/thermal characteristics

Sébastien Frégonèse, Yan Zhuang, Joachim N. Burghartz

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	919-925
Number of pages	7
Journal	Solid-State Electronics
Volume	52
Issue number	6
DOIs	https://doi.org/10.1016/j.sse.2008.01.022
State	Published - Jun 2008
Externally published	Yes

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

Keywords

d-DOT FET
MOS
Self-heating
Short channel effect
Strain
Stress

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10.1016/j.sse.2008.01.022

Cite this

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title = "Modeling of strained CMOS on disposable SiGe dots: Shape impacts on electrical/thermal characteristics",

keywords = "d-DOT FET, MOS, Self-heating, Short channel effect, Strain, Stress",

author = "S{\'e}bastien Fr{\'e}gon{\`e}se and Yan Zhuang and Burghartz, {Joachim N.}",

year = "2008",

month = jun,

doi = "10.1016/j.sse.2008.01.022",

language = "English",

volume = "52",

pages = "919--925",

journal = "Solid-State Electronics",

issn = "0038-1101",

number = "6",

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TY - JOUR

T1 - Modeling of strained CMOS on disposable SiGe dots

T2 - Shape impacts on electrical/thermal characteristics

AU - Frégonèse, Sébastien

AU - Zhuang, Yan

AU - Burghartz, Joachim N.

PY - 2008/6

Y1 - 2008/6

KW - d-DOT FET

KW - MOS

KW - Self-heating

KW - Short channel effect

KW - Strain

KW - Stress

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U2 - 10.1016/j.sse.2008.01.022

DO - 10.1016/j.sse.2008.01.022

M3 - Article

AN - SCOPUS:42749094948

SN - 0038-1101

VL - 52

SP - 919

EP - 925

JO - Solid-State Electronics

JF - Solid-State Electronics

IS - 6

ER -

Modeling of strained CMOS on disposable SiGe dots: Shape impacts on electrical/thermal characteristics

ASJC Scopus Subject Areas

Keywords

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