No- Reference Image Quality Assessment for Intelligent Sensing Applications

Zhuobin Yuan, Ademola Ikusan, Rui Dai, Junjie Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationNAECON 2024 - IEEE National Aerospace and Electronics Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages185-189
Number of pages5
ISBN (Electronic)9798350367621
DOIs
StatePublished - 2024
Externally publishedYes
Event76th Annual IEEE National Aerospace and Electronics Conference, NAECON 2024 - Dayton, United States
Duration: Jul 15 2024Jul 18 2024

Publication series

NameProceedings of the IEEE National Aerospace Electronics Conference, NAECON
ISSN (Print)0547-3578
ISSN (Electronic)2379-2027

Conference

Conference76th Annual IEEE National Aerospace and Electronics Conference, NAECON 2024
Country/TerritoryUnited States
CityDayton
Period7/15/247/18/24

ASJC Scopus Subject Areas

  • Computer Networks and Communications
  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Keywords

  • com-puter vision
  • image classification
  • image quality assessment
  • image seg-mentation
  • no-reference
  • object detection

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