Non-Contact, Antenna-Free Probe for Characterization of THz Devices and Components

A. Mingardi; W. D. Zhang; E. R. Brown

doi:10.1109/NAECON.2016.7856845

Non-Contact, Antenna-Free Probe for Characterization of THz Devices and Components

A. Mingardi, W. D. Zhang, E. R. Brown

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper presents fabrication and testing of a contact-free, antenna-free probe for characterizing planar semiconducting devices in the THz region.

Original language	English
Title of host publication	Proceedings of the 2016 IEEE National Aerospace and Electronics Conference-Ohio Innovation Summit, NAECON-OIS 2016
Editors	Ronald Brower
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	441-444
Number of pages	4
ISBN (Electronic)	9781509034413
DOIs	https://doi.org/10.1109/NAECON.2016.7856845
State	Published - Jul 2 2016
Event	2016 IEEE National Aerospace and Electronics Conference and Ohio Innovation Summit, NAECON-OIS 2016 - Dayton, United States Duration: Jul 26 2016 → Jul 29 2016

Publication series

Name	Proceedings of the IEEE National Aerospace Electronics Conference, NAECON
Volume	0
ISSN (Print)	0547-3578
ISSN (Electronic)	2379-2027

Conference

Conference	2016 IEEE National Aerospace and Electronics Conference and Ohio Innovation Summit, NAECON-OIS 2016
Country/Territory	United States
City	Dayton
Period	7/26/16 → 7/29/16

ASJC Scopus Subject Areas

Computer Networks and Communications
Computer Science Applications
Control and Systems Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/NAECON.2016.7856845

Cite this

Mingardi, A., Zhang, W. D., & Brown, E. R. (2016). Non-Contact, Antenna-Free Probe for Characterization of THz Devices and Components. In R. Brower (Ed.), Proceedings of the 2016 IEEE National Aerospace and Electronics Conference-Ohio Innovation Summit, NAECON-OIS 2016 (pp. 441-444). Article 7856845 (Proceedings of the IEEE National Aerospace Electronics Conference, NAECON; Vol. 0). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NAECON.2016.7856845

Non-Contact, Antenna-Free Probe for Characterization of THz Devices and Components. / Mingardi, A.; Zhang, W. D.; Brown, E. R.
Proceedings of the 2016 IEEE National Aerospace and Electronics Conference-Ohio Innovation Summit, NAECON-OIS 2016. ed. / Ronald Brower. Institute of Electrical and Electronics Engineers Inc., 2016. p. 441-444 7856845 (Proceedings of the IEEE National Aerospace Electronics Conference, NAECON; Vol. 0).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Mingardi, A, Zhang, WD & Brown, ER 2016, Non-Contact, Antenna-Free Probe for Characterization of THz Devices and Components. in R Brower (ed.), Proceedings of the 2016 IEEE National Aerospace and Electronics Conference-Ohio Innovation Summit, NAECON-OIS 2016., 7856845, Proceedings of the IEEE National Aerospace Electronics Conference, NAECON, vol. 0, Institute of Electrical and Electronics Engineers Inc., pp. 441-444, 2016 IEEE National Aerospace and Electronics Conference and Ohio Innovation Summit, NAECON-OIS 2016, Dayton, United States, 7/26/16. https://doi.org/10.1109/NAECON.2016.7856845

Mingardi A, Zhang WD, Brown ER. Non-Contact, Antenna-Free Probe for Characterization of THz Devices and Components. In Brower R, editor, Proceedings of the 2016 IEEE National Aerospace and Electronics Conference-Ohio Innovation Summit, NAECON-OIS 2016. Institute of Electrical and Electronics Engineers Inc. 2016. p. 441-444. 7856845. (Proceedings of the IEEE National Aerospace Electronics Conference, NAECON). doi: 10.1109/NAECON.2016.7856845

Mingardi, A. ; Zhang, W. D. ; Brown, E. R. / Non-Contact, Antenna-Free Probe for Characterization of THz Devices and Components. Proceedings of the 2016 IEEE National Aerospace and Electronics Conference-Ohio Innovation Summit, NAECON-OIS 2016. editor / Ronald Brower. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 441-444 (Proceedings of the IEEE National Aerospace Electronics Conference, NAECON).

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Non-Contact, Antenna-Free Probe for Characterization of THz Devices and Components

Abstract

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ASJC Scopus Subject Areas

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