Non-contact probes for characterization of THz devices and components

Matthieu Martin; Prasanna Kumar Daram; Elliott R. Brown

doi:10.1109/IRMMW-THz.2014.6956286

Non-contact probes for characterization of THz devices and components

Matthieu Martin, Prasanna Kumar Daram, Elliott R. Brown

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014
Publisher	IEEE Computer Society
ISBN (Electronic)	9781479938773
DOIs	https://doi.org/10.1109/IRMMW-THz.2014.6956286
State	Published - Nov 13 2014
Externally published	Yes
Event	39th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2014 - Tucson, United States Duration: Sep 14 2014 → Sep 19 2014

Publication series

Name	International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
ISSN (Print)	2162-2027
ISSN (Electronic)	2162-2035

Conference

Conference	39th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2014
Country/Territory	United States
City	Tucson
Period	9/14/14 → 9/19/14

ASJC Scopus Subject Areas

Energy Engineering and Power Technology
Electrical and Electronic Engineering

Access to Document

10.1109/IRMMW-THz.2014.6956286

Cite this

Martin, M., Daram, P. K., & Brown, E. R. (2014). Non-contact probes for characterization of THz devices and components. In 2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014 Article 6956286 (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz). IEEE Computer Society. https://doi.org/10.1109/IRMMW-THz.2014.6956286

Non-contact probes for characterization of THz devices and components. / Martin, Matthieu; Daram, Prasanna Kumar; Brown, Elliott R.
2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014. IEEE Computer Society, 2014. 6956286 (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Martin, M, Daram, PK & Brown, ER 2014, Non-contact probes for characterization of THz devices and components. in 2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014., 6956286, International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz, IEEE Computer Society, 39th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2014, Tucson, United States, 9/14/14. https://doi.org/10.1109/IRMMW-THz.2014.6956286

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Non-contact probes for characterization of THz devices and components

Publication series

Conference

ASJC Scopus Subject Areas

Access to Document

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Cite this