Nondestructive quantitative mapping of impurities and point defects in thin films: Ga and V_Zn in ZnO:Ga

TY - JOUR

T1 - Nondestructive quantitative mapping of impurities and point defects in thin films

T2 - Ga and VZn in ZnO:Ga

AU - Look, David C.

AU - Leedy, Kevin D.

AU - Agresta, Donald L.

PY - 2014/6/16

Y1 - 2014/6/16

UR - https://www.scopus.com/pages/publications/84903164678

UR - https://www.scopus.com/inward/citedby.url?scp=84903164678&partnerID=8YFLogxK

U2 - 10.1063/1.4884347

DO - 10.1063/1.4884347

M3 - Article

AN - SCOPUS:84903164678

SN - 0003-6951

VL - 104

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 24

M1 - 242107

ER -