Observation of deep defects in As-rich GaAs grown by the molecular beam epitaxy technique at 200°C

M. O. Manasreh, D. C. Look, K. R. Evans, C. E. Stutz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the 6th Conference on Semi-Insulating III-V
PublisherPubl by IEEE
Pages105-110
Number of pages6
ISBN (Print)0750300663
StatePublished - 1990
Externally publishedYes
EventProceedings of the 6th Conference on Semi-Insulating III-V Materials - Toronto, Ont, Can
Duration: May 13 1990May 16 1990

Publication series

NameProceedings of the 6th Conference on Semi-Insulating III-V

Conference

ConferenceProceedings of the 6th Conference on Semi-Insulating III-V Materials
CityToronto, Ont, Can
Period5/13/905/16/90

ASJC Scopus Subject Areas

  • General Engineering

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