On-wafer Hall-effect measurement system

P. D. Mumford, D. C. Look

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1666-1667
Number of pages2
JournalReview of Scientific Instruments
Volume62
Issue number6
DOIs
StatePublished - 1991

ASJC Scopus Subject Areas

  • Instrumentation

Cite this