Parameter identification for semiconductor diodes by LBIC imaging

Weifu Fang, Kazufumi Ito, David A. Redfern

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)2149-2174
Number of pages26
JournalSIAM Journal on Applied Mathematics
Volume62
Issue number6
DOIs
StatePublished - Jul 2002
Externally publishedYes

ASJC Scopus Subject Areas

  • Applied Mathematics

Keywords

  • Discontinuous coefficients
  • Drift-diffusion
  • Elliptic partial differential equations/systems
  • Inverse problems
  • LBIC
  • Parameter identification
  • Semiconductor diodes

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