Persistent photocurrent and deep level traps in PLD-grown In-Ga-Zn-O thin films studied by thermally stimulated current spectroscopy

Buguo Wang, Jason Anders, Kevin Leedy, Michael Schuette, David Look

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationOxide-Based Materials and Devices IX
EditorsDavid J. Rogers, Ferechteh H. Teherani, David C. Look
PublisherSPIE
ISBN (Electronic)9781510615519
DOIs
StatePublished - 2018
EventOxide-Based Materials and Devices IX 2018 - San Francisco, United States
Duration: Jan 28 2018Feb 1 2018

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10533
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOxide-Based Materials and Devices IX 2018
Country/TerritoryUnited States
CitySan Francisco
Period1/28/182/1/18

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Keywords

  • electronic defects
  • InGaZnO (IGZO)
  • persistent photocurrent (PPC), thermally stimulated current (TSC) spectroscopy
  • photocurrent (PC)
  • pulse laser deposition (PLD), dark current (DC)
  • thermal annealing

Cite this