## Abstract

In general, diffraction patterns from the higher-order Laue zones are shifted with respect to the zero-order pattern. Expressions for the shift ( * t * ) have been derived in terms of the indices [

*u, v, w*] of a zone, the interplanar spacing (

*), and a reciprocal lattice vector [*

**H***] in a holz. The resulting vector possesses the direction of*

**g**_{ L }(hkl)*in terms of a zolz reciprocal lattice vector and has a magnitude which is a fraction of that of the zolz vector. Hence, the calculation of*

**t***allows quantitative determination of the location of specific planes in a holz with respect to the zolz, thus simplifying the determination of plane indices consistent with those used in the zolz. The expressions for determining*

**t***for cubic, hexagonal close-packed (hep), tetragonal, orthorhombic, and monoclinic crystal types are presented in a table and, when applied, allow calculation of*

**t***expressed as a fraction of a zolz vector. An example for graphite is presented to illustrate the use of the equation, and*

**t***vectors for several zones for the simple cubic system are tabulated.*

**t**Original language | American English |
---|---|

Journal | Journal of Electron Microscopy Technique |

Volume | 5 |

DOIs | |

State | Published - Apr 1 1987 |

## Keywords

- Electron Diffraction
- Holz Patterns
- Laue Zones