Reconstruction of semiconductor doping profile from laser-beam-induced current image

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1067-1082
Number of pages	16
Journal	SIAM Journal on Applied Mathematics
Volume	54
Issue number	4
DOIs	https://doi.org/10.1137/S0036139992234804
State	Published - 1994
Externally published	Yes

ASJC Scopus Subject Areas

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title = "Reconstruction of semiconductor doping profile from laser-beam-induced current image",

author = "Weifu Fang and Kazufumi Ito",

year = "1994",

doi = "10.1137/S0036139992234804",

language = "English",

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journal = "SIAM Journal on Applied Mathematics",

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AU - Fang, Weifu

AU - Ito, Kazufumi

PY - 1994

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JF - SIAM Journal on Applied Mathematics

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