TY - JOUR
T1 - Recovery of an interface from boundary measurement in an elliptic differential equation
AU - Fang, Weifu
AU - Zeng, Suxing
N1 - We study the inverse problem of recovering an interior interface from a boundary measurement in an elliptic boundary value problem arising from a semiconductor transistor model. We set up a nonlinear least-squares formulation for solving the inverse problem, and establish the necessary derivatives with respect to the interface.
PY - 2012/2
Y1 - 2012/2
UR - http://www.scopus.com/inward/record.url?scp=84856489837&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84856489837&partnerID=8YFLogxK
UR - https://link.springer.com/article/10.1007/s10444-011-9204-5
U2 - 10.1007/s10444-011-9204-5
DO - 10.1007/s10444-011-9204-5
M3 - Article
AN - SCOPUS:84856489837
SN - 1019-7168
VL - 36
SP - 201
EP - 220
JO - Advances in Computational Mathematics
JF - Advances in Computational Mathematics
IS - 2
ER -