Scanning microwave microscopy characterization of spin-spray-deposited ferrite/nonmagnetic films

Yun Xing, Joshua Myers, Ogheneyunume Obi, Nian X. Sun, Yan Zhuang

Research output: Contribution to journalArticlepeer-review

Abstract

In this study, we performed single-grain-boundary characterization of ferrite films at radio and microwave frequencies using scanning microwave microscopy (SMM). The sample consisted of Fe 3O 4/ photoresist/Fe 3O 4 multilayers deposited on glass substrate at 90°C by spin-spray coating. SMM images were recorded at various resonant frequencies between 2.0 GHz and 8.0 GHz. These images showed higher electrical conductivity at grain boundaries than at the core of grains. This phenomenon can be explained by space-charge accumulation at the grain boundary.
Original languageEnglish
Pages (from-to)530-534
Number of pages5
JournalJournal of Electronic Materials
Volume41
Issue number3
Early online dateDec 30 2011
DOIs
StatePublished - Mar 2012

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Keywords

  • Ferrite
  • Nano imaging
  • Radiofrequency
  • Scanning microwave microscopy
  • Spray coating
  • Ferrite, Nano imaging, Radiofrequency, Scanning microwave microscopy, Spray coating

Disciplines

  • Electrical and Computer Engineering

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