Abstract
In this study, we performed single-grain-boundary characterization of ferrite films at radio and microwave frequencies using scanning microwave microscopy (SMM). The sample consisted of Fe 3O 4/ photoresist/Fe 3O 4 multilayers deposited on glass substrate at 90°C by spin-spray coating. SMM images were recorded at various resonant frequencies between 2.0 GHz and 8.0 GHz. These images showed higher electrical conductivity at grain boundaries than at the core of grains. This phenomenon can be explained by space-charge accumulation at the grain boundary.
Original language | English |
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Pages (from-to) | 530-534 |
Number of pages | 5 |
Journal | Journal of Electronic Materials |
Volume | 41 |
Issue number | 3 |
Early online date | Dec 30 2011 |
DOIs | |
State | Published - Mar 2012 |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry
Keywords
- Ferrite
- Nano imaging
- Radiofrequency
- Scanning microwave microscopy
- Spray coating
- Ferrite, Nano imaging, Radiofrequency, Scanning microwave microscopy, Spray coating
Disciplines
- Electrical and Computer Engineering