Schottky-barrier mobility profiling measurements with gate-current corrections

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@article{90d12d87f4914cf896ae50f696060e54,

title = "Schottky-barrier mobility profiling measurements with gate-current corrections",

author = "Look, {D. C.} and Cooper, {T. A.}",

year = "1985",

month = may,

doi = "10.1016/0038-1101(85)90117-0",

language = "English",

volume = "28",

pages = "521--527",

journal = "Solid-State Electronics",

issn = "0038-1101",

number = "5",

}

TY - JOUR

T1 - Schottky-barrier mobility profiling measurements with gate-current corrections

AU - Look, D. C.

AU - Cooper, T. A.

PY - 1985/5

Y1 - 1985/5

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U2 - 10.1016/0038-1101(85)90117-0

DO - 10.1016/0038-1101(85)90117-0

M3 - Article

AN - SCOPUS:0022061432

SN - 0038-1101

VL - 28

SP - 521

EP - 527

JO - Solid-State Electronics

JF - Solid-State Electronics

IS - 5

ER -