Schottky-barrier profiling techniques in semiconductors: Gate current and parasitic resistance effects

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title = "Schottky-barrier profiling techniques in semiconductors: Gate current and parasitic resistance effects",

author = "Look, {D. C.}",

year = "1985",

doi = "10.1063/1.334762",

language = "English",

volume = "57",

pages = "377--383",

journal = "Journal of Applied Physics",

issn = "0021-8979",

number = "2",

}

TY - JOUR

T1 - Schottky-barrier profiling techniques in semiconductors

T2 - Gate current and parasitic resistance effects

AU - Look, D. C.

PY - 1985

Y1 - 1985

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U2 - 10.1063/1.334762

DO - 10.1063/1.334762

M3 - Article

AN - SCOPUS:36549102250

SN - 0021-8979

VL - 57

SP - 377

EP - 383

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 2

ER -