Sensitivity and resolution of evanescent microwave microscope

Richard A. Kleismit, Marian K. Kazimierczuk, Gregory Kozlowski

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)639-646
Number of pages8
JournalIEEE Transactions on Microwave Theory and Techniques
Volume54
Issue number2
DOIs
StatePublished - Feb 2006
Externally publishedYes

ASJC Scopus Subject Areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Keywords

  • Complex permittivity
  • Evanescent microwave microscopy
  • Near-field
  • Nondestructive evaluation
  • Resolution
  • Sensitivity
  • Sensor
  • Superconductors

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