SMM studies on high-frequency electrical properties of nanostructured materials

Y. Zhuang; J. Myers; Z. Ji; K. Vishal

doi:10.1016/B978-0-12-819905-3.00018-X

SMM studies on high-frequency electrical properties of nanostructured materials

Y. Zhuang, J. Myers, Z. Ji, K. Vishal

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Original language	English
Title of host publication	Modeling, Characterization, and Production of Nanomaterials
Subtitle of host publication	Electronics, Photonics, and Energy Applications, Second Edition
Publisher	Elsevier
Pages	513-534
Number of pages	22
ISBN (Electronic)	9780128199053
ISBN (Print)	9780128199190
DOIs	https://doi.org/10.1016/B978-0-12-819905-3.00018-X
State	Published - Jan 1 2022
Externally published	Yes

ASJC Scopus Subject Areas

General Engineering

Keywords

Microscope
Microwave
Near-field
Radio frequency
SMM

Access to Document

10.1016/B978-0-12-819905-3.00018-X

Cite this

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title = "SMM studies on high-frequency electrical properties of nanostructured materials",

keywords = "Microscope, Microwave, Near-field, Radio frequency, SMM",

author = "Y. Zhuang and J. Myers and Z. Ji and K. Vishal",

year = "2022",

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doi = "10.1016/B978-0-12-819905-3.00018-X",

language = "English",

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pages = "513--534",

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TY - CHAP

T1 - SMM studies on high-frequency electrical properties of nanostructured materials

AU - Zhuang, Y.

AU - Myers, J.

AU - Ji, Z.

AU - Vishal, K.

PY - 2022/1/1

Y1 - 2022/1/1

KW - Microscope

KW - Microwave

KW - Near-field

KW - Radio frequency

KW - SMM

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U2 - 10.1016/B978-0-12-819905-3.00018-X

DO - 10.1016/B978-0-12-819905-3.00018-X

M3 - Chapter

AN - SCOPUS:85150126895

SN - 9780128199190

SP - 513

EP - 534

BT - Modeling, Characterization, and Production of Nanomaterials

PB - Elsevier

ER -

SMM studies on high-frequency electrical properties of nanostructured materials

ASJC Scopus Subject Areas

Keywords

Access to Document

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