Study of double barrier superlattice by synchrotron radiation and double‐crystal x‐ray diffraction

Yan Zhuang, Y. T. Wang, D. S. Jiang, X. P. Yang, X. M. Jiang, J. Y. Wu, L. S. Xiu, W. L. Zheng

Research output: Contribution to journalLetterpeer-review

Abstract

An (AlAs/GaAs/AlAs/AlGaAs)/GaAs(001) double‐barrier superlattice grown by molecular beam epitaxy (MBE) is studied by combining synchrotron radiation and double‐crystal x‐ray diffraction (DCD). The intensity of satellite peaks is modulated by the wave function of each sublayer in one superlattice period. Simulated by the x‐ray dynamical diffraction theory, it is discovered that the intensity of the satellite peaks situated near the modulating wave node point of each sublayer is very sensitive to the variation of the layer structural parameters. The accurate layer thickness of each sublayer is obtained with an error less than 1 Å. Furthermore, x‐ray kinematical diffraction theory is used to explain the modulation phenomenon.
Original languageAmerican English
Pages (from-to)1147–1149
JournalApplied Physics Letters
Volume68
Issue number8
DOIs
StatePublished - Feb 19 1996
Externally publishedYes

Keywords

  • Superlattices
  • Synchrotron radiation
  • X-ray diffraction

Disciplines

  • Electrical and Computer Engineering

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