| Original language | English |
|---|---|
| Pages (from-to) | 340-355 |
| Number of pages | 16 |
| Journal | IEEE Sensors Journal |
| Volume | 6 |
| Issue number | 2 |
| DOIs | |
| State | Published - Apr 1 2006 |
ASJC Scopus Subject Areas
- Instrumentation
- Electrical and Electronic Engineering
Keywords
- Piezoresistance
- Silicon sensor
- Stress sensor
- Stress test chip
- Van der pauw (VDP) structure
Disciplines
- Engineering
- Materials Science and Engineering
- Mechanical Engineering