Wafer-level correlations of EL2, dislocation density, and FET saturation current at various processing stages

D. C. Look, D. C. Walters, R. T. Kemerley, J. M. King, M. G. Mier, J. S. Sewell, J. S. Sizelove

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)487-492
Number of pages6
JournalJournal of Electronic Materials
Volume18
Issue number4
DOIs
StatePublished - Jul 1989
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Keywords

  • Correlations
  • dislocation density
  • EL2
  • saturation current

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