Wafer-level correlations of EL2, dislocation density, and FET saturation current at various processing stages

  • D. C. Look
  • , D. C. Walters
  • , R. T. Kemerley
  • , J. M. King
  • , M. G. Mier
  • , J. S. Sewell
  • , J. S. Sizelove

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)487-492
Number of pages6
JournalJournal of Electronic Materials
Volume18
Issue number4
DOIs
StatePublished - Jul 1989
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Keywords

  • Correlations
  • dislocation density
  • EL2
  • saturation current

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