X-ray double-crystal diffractometry characterization of semi-insulating GaAs

S. Shah; J. Chadhuri; M. Mier; D. C. Look

doi:10.1007/BF00581087

X-ray double-crystal diffractometry characterization of semi-insulating GaAs

S. Shah, J. Chadhuri, M. Mier, D. C. Look

Future of Semiconductors, a National Science Foundation Program

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	4298-4300
Number of pages	3
Journal	Journal of Materials Science
Volume	25
Issue number	10
DOIs	https://doi.org/10.1007/BF00581087
State	Published - Oct 1990

ASJC Scopus Subject Areas

Ceramics and Composites
Materials Science (miscellaneous)
General Materials Science
Mechanics of Materials
Mechanical Engineering
Polymers and Plastics

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10.1007/BF00581087

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title = "X-ray double-crystal diffractometry characterization of semi-insulating GaAs",

author = "S. Shah and J. Chadhuri and M. Mier and Look, \{D. C.\}",

year = "1990",

month = oct,

doi = "10.1007/BF00581087",

language = "English",

volume = "25",

pages = "4298--4300",

journal = "Journal of Materials Science",

issn = "0022-2461",

number = "10",

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T1 - X-ray double-crystal diffractometry characterization of semi-insulating GaAs

AU - Shah, S.

AU - Chadhuri, J.

AU - Mier, M.

AU - Look, D. C.

PY - 1990/10

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EP - 4300

JO - Journal of Materials Science

JF - Journal of Materials Science

IS - 10

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X-ray double-crystal diffractometry characterization of semi-insulating GaAs

ASJC Scopus Subject Areas

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